DBGP2012

Mickaël Delahaye, Lionel C. Briand, Arnaud Gotlieb, Matthieu Petit. MuTIL: Mutation-based Statistical Test Inputs Generation for Automatic Fault Localization. In International Conference on Software Security and Reliability (SERE 2012), Pages 197-206, Gaithersburg, Maryland, USA, June 2012.

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Mickael Delahaye

BibTex Reference

@InProceedings{DBGP2012,
   Author = {Delahaye, Mickaël and Briand, Lionel C. and Gotlieb, Arnaud and Petit, Matthieu},
   Title = {{M}u{TIL}: {M}utation-based {S}tatistical {T}est {I}nputs {G}eneration for {A}utomatic {F}ault {L}ocalization},
   BookTitle = {{I}nternational {C}onference on {S}oftware {S}ecurity and {R}eliability ({SERE} 2012)},
   Pages = {197--206},
   Publisher = {IEEE},
   Address = {Gaithersburg, Maryland, USA},
   Month = {June},
   Year = {2012}
}

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