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DBLP:conf_icst_BousquetS08

Lydie du Bousquet, Muhammad-Rabee Shaheen. Relation between Depth of Inheritance Tree and Number of Methods to Test. In First International Conference on Software Testing, Verification, and Validation, ICST 2008, Pages 161-170, Lillehammer, Norway, April 2008.

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Muhammad-Rabee Shaheen

BibTex Reference

@InProceedings{DBLP:conf_icst_BousquetS08,
   Author = {du Bousquet, Lydie and Shaheen, Muhammad-Rabee},
   Title = {Relation between Depth of Inheritance Tree and Number of Methods to Test},
   BookTitle = {First International Conference on Software Testing, Verification, and Validation, ICST 2008},
   Pages = {161--170},
   Publisher = {IEEE Computer Society},
   Address = {Lillehammer, Norway},
   Month = {April},
   Year = {2008}
}

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