M.-R. Shaheen, L. du Bousquet. Is Depth of Inheritance Tree a Good Cost Prediction For Branch Coverage Testing?. In First International Conference on Advances in System Testing and Validation Lifecycle VALID, Pages 42-47, Porto, Portugal, September 2009.
@InProceedings{valid09,
Author = {Shaheen, M.-R. and du Bousquet, L.},
Title = {Is Depth of Inheritance Tree a Good Cost Prediction For Branch Coverage Testing?},
BookTitle = {First International Conference on Advances in System Testing and Validation Lifecycle VALID},
Pages = {42--47},
Publisher = {IEEE},
Address = {Porto, Portugal},
Month = {September},
Year = {2009}
}
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